Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.
Journal of Electronic Testing: : Theory and Applications, Springer Verlag, 2005, 21 (2), pp.169-179.
⟨10.1007/s10836-005-6146-1⟩.
⟨lirmm-00105313⟩