Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Data Retention Fault in SRAM Memories: Analysis and Detection Procedures.
23rd IEEE VLSI Test Symposium (VTS), May 2005, Palm Springs, CA, United States. pp.183-188,
⟨10.1109/VTS.2005.37⟩.
⟨lirmm-00105995⟩