Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2005

Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies

I. Polian
  • Function : Author
Kundu Sandip
  • Function : Author
P. Engelke
  • Function : Author
P. Becker
  • Function : Author
No file

Dates and versions

lirmm-00105997 , version 1 (13-10-2006)

Identifiers

  • HAL Id : lirmm-00105997 , version 1

Cite

I. Polian, Kundu Sandip, Jean-Marc J.-M. Galliere, P. Engelke, Michel Renovell, et al.. Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies. VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348. ⟨lirmm-00105997⟩
59 View
0 Download

Share

Gmail Facebook X LinkedIn More