Conference Papers
Year : 2005
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105997
Submitted on : Friday, October 13, 2006-10:22:45 AM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : lirmm-00105997 , version 1
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I. Polian, Kundu Sandip, Jean-Marc J.-M. Galliere, P. Engelke, Michel Renovell, et al.. Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies. VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348. ⟨lirmm-00105997⟩
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