Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2005

Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies

I. Polian
  • Function : Author
Kundu Sandip
  • Function : Author
Jean-Marc J.-M. Galliere
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
CV
P. Engelke
  • Function : Author
Michel Renovell
Conception et Test de Systèmes MICroélectroniques
CV
P. Becker
  • Function : Author

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105997

Submitted on : Friday, October 13, 2006-10:22:45 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00105997 , version 1 (13-10-2006)

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  • HAL Id : lirmm-00105997 , version 1

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I. Polian, Kundu Sandip, Jean-Marc J.-M. Galliere, P. Engelke, Michel Renovell, et al.. Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies. VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348. ⟨lirmm-00105997⟩

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