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Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies

I. Polian Kundu Sandip Jean-Marc J.-M. Galliere 1 P. Engelke Michel Renovell 2 P. Becker 
1 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105997
Contributor : Christine Carvalho De Matos Connect in order to contact the contributor
Submitted on : Friday, October 13, 2006 - 10:22:45 AM
Last modification on : Friday, August 5, 2022 - 10:47:53 AM

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  • HAL Id : lirmm-00105997, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

I. Polian, Kundu Sandip, Jean-Marc J.-M. Galliere, P. Engelke, Michel Renovell, et al.. Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies. VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348. ⟨lirmm-00105997⟩

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