Power-Driven Routing-Constrained Scan Chain Design - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2004

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lirmm-00108581 , version 1 (23-10-2006)

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Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch. Power-Driven Routing-Constrained Scan Chain Design. Journal of Electronic Testing: : Theory and Applications, 2004, 20 (6), pp.647-660. ⟨10.1007/s10677-004-4252-2⟩. ⟨lirmm-00108581⟩
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