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Conference Papers Year : 2004

Automatic Test Pattern Generation for Resistive Bridging Faults

Piet Engelke
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I. Polian
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P. Becker
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lirmm-00108902 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108902 , version 1

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Piet Engelke, I. Polian, Michel Renovell, P. Becker. Automatic Test Pattern Generation for Resistive Bridging Faults. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.160-165. ⟨lirmm-00108902⟩
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