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Realistic Fault Models for Defects in Electronic Circuits

Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109134
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, October 24, 2006 - 7:31:53 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00109134, version 1

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Michel Renovell. Realistic Fault Models for Defects in Electronic Circuits. BEC'04: International Baltic Electronic Conference, Oct 2004, pp.33-37. ⟨lirmm-00109134⟩

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