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Conference papers

Electrically-Induced Thermal Stimuli for MEMS Testing

Pascal Nouet 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109142
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, October 24, 2006 - 7:31:56 AM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00109142, version 1

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Pascal Nouet. Electrically-Induced Thermal Stimuli for MEMS Testing. 1st DfMM Summer School, 2004. ⟨lirmm-00109142⟩

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