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Conference papers

Electrically-Induced Thermal Stimuli for MEMS Testing

Pascal Nouet 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109142
Contributor : Christine Carvalho De Matos Connect in order to contact the contributor
Submitted on : Tuesday, October 24, 2006 - 7:31:56 AM
Last modification on : Friday, August 5, 2022 - 10:47:53 AM

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  • HAL Id : lirmm-00109142, version 1

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Pascal Nouet. Electrically-Induced Thermal Stimuli for MEMS Testing. 1st DfMM Summer School, 2004. ⟨lirmm-00109142⟩

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