March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2006
No file

Dates and versions

lirmm-00134776 , version 1 (05-03-2007)

Identifiers

  • HAL Id : lirmm-00134776 , version 1

Cite

Luigi Dilillo, Patrick Girard, Magali Bastian Hage-Hassan, Serge Pravossoudovitch, Arnaud Virazel. March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261. ⟨lirmm-00134776⟩
79 View
0 Download

Share

Gmail Facebook X LinkedIn More