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March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00134776
Contributor : Christian Landrault <>
Submitted on : Monday, March 5, 2007 - 1:47:48 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00134776, version 1

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Luigi Dilillo, Patrick Girard, Magali Bastian Hage-Hassan, Serge Pravossoudovitch, Arnaud Virazel. March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261. ⟨lirmm-00134776⟩

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