Proceedings of the 3rd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006) - Jan 17-19, 2006 - Kuala Lumpur, Malaysia - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Books Year : 2006

Proceedings of the 3rd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006) - Jan 17-19, 2006 - Kuala Lumpur, Malaysia

Adam Osseiran
  • Function : Scientific advisor
Moi Tin Chew
  • Function : Scientific advisor

Abstract

The following topics are dealt with: fault diagnosis; analog components; integrated circuit design; image and video processing; integrated circuit testing; electronics education; logic design and optimization; electromagnetic sensors and devices; fault modeling; microprocessors; microphotonics; built in self test; fault tolerance; signal processing; design verification and concurrent checking
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Dates and versions

lirmm-00136923 , version 1 (15-03-2007)

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Patrick Girard, Adam Osseiran, Moi Tin Chew (Dir.). Proceedings of the 3rd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006) - Jan 17-19, 2006 - Kuala Lumpur, Malaysia. 500 p., 2006, 0-7695-2500-8. ⟨10.1109/DELTA.2006.89⟩. ⟨lirmm-00136923⟩
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