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Proceedings of the 3rd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006) - Jan 17-19, 2006 - Kuala Lumpur, Malaysia

Patrick Girard 1 Adam Osseiran 2 Moi Tin Chew 3
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : The following topics are dealt with: fault diagnosis; analog components; integrated circuit design; image and video processing; integrated circuit testing; electronics education; logic design and optimization; electromagnetic sensors and devices; fault modeling; microprocessors; microphotonics; built in self test; fault tolerance; signal processing; design verification and concurrent checking
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00136923
Contributor : Patrick Girard <>
Submitted on : Thursday, March 15, 2007 - 6:05:31 PM
Last modification on : Saturday, November 28, 2020 - 3:31:24 PM

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Patrick Girard, Adam Osseiran, Moi Tin Chew. Proceedings of the 3rd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006) - Jan 17-19, 2006 - Kuala Lumpur, Malaysia. 500 p., 2006, 0-7695-2500-8. ⟨10.1109/DELTA.2006.89⟩. ⟨lirmm-00136923⟩

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