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International Conference on Design and Test of Integrated Systems in Nanoscale Technology (DTIS 2006)

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00136926
Contributor : Patrick Girard <>
Submitted on : Thursday, March 15, 2007 - 6:15:20 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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Patrick Girard, Michel Renovell, Mohamed Masmoudi, Jaouhar Mouine. International Conference on Design and Test of Integrated Systems in Nanoscale Technology (DTIS 2006). Tunis, Tunisia. IEEE, 447 p., 2006, 0-7803-9726-6. ⟨10.1109/DTIS.2006.1708761⟩. ⟨lirmm-00136926⟩

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