Dynamic Two-Cell Incorrect Read Fault due to Resistive-Open Defects in the Sense Amplifiers of SRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2007
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lirmm-00158116 , version 1 (28-06-2007)

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Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, et al.. Dynamic Two-Cell Incorrect Read Fault due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.97-104, ⟨10.1109/ETS.2007.19⟩. ⟨lirmm-00158116⟩
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