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Dynamic Two-Cell Incorrect Read Fault due to Resistive-Open Defects in the Sense Amplifiers of SRAMs

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00158116
Contributor : Martine Peridier <>
Submitted on : Thursday, June 28, 2007 - 10:01:18 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, et al.. Dynamic Two-Cell Incorrect Read Fault due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.97-104, ⟨10.1109/ETS.2007.19⟩. ⟨lirmm-00158116⟩

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