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Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators

Vincent Kerzérho 1 Philippe Cauvet 2 Serge Bernard 1 Florence Azaïs 1 Michel Renovell 1 Mariane Comte 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00161708
Contributor : Martine Peridier <>
Submitted on : Wednesday, July 11, 2007 - 2:29:01 PM
Last modification on : Wednesday, August 28, 2019 - 7:12:02 PM

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  • HAL Id : lirmm-00161708, version 1

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Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators. IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201. ⟨lirmm-00161708⟩

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