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Test Data Compression and TAM Design

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00186171
Contributor : Martine Peridier <>
Submitted on : Thursday, November 8, 2007 - 11:07:52 AM
Last modification on : Tuesday, October 23, 2018 - 10:46:02 AM

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  • HAL Id : lirmm-00186171, version 1

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Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre. Test Data Compression and TAM Design. IFIP VLSI-SOC 2007 - IFIP WG 10.5 International Conference on Very Large Scale Integration, Oct 2007, Atlanta, GA, USA, pp.178-183. ⟨lirmm-00186171⟩

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