Test Power: A Big Issue in Large SOC Design

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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268493
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:32 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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Yannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch. Test Power: A Big Issue in Large SOC Design. IEEE International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.447-449. ⟨lirmm-00268493⟩

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