Test Power: A Big Issue in Large SOC Design - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2002
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lirmm-00268493 , version 1 (01-04-2008)

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  • HAL Id : lirmm-00268493 , version 1

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Yannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch. Test Power: A Big Issue in Large SOC Design. IEEE International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.447-449. ⟨lirmm-00268493⟩
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