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Conference papers

Functional Test Generation Using Constraint Logic Programming

Z. Zeng M. Ciesielski Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268536
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:42 AM
Last modification on : Tuesday, October 23, 2018 - 10:46:02 AM

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  • HAL Id : lirmm-00268536, version 1

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Z. Zeng, M. Ciesielski, Bruno Rouzeyre. Functional Test Generation Using Constraint Logic Programming. SoC Design Methodologies - International Conference on Very Large Scale Integration of Systems-on-Chip, Montpellier, France, pp.375-386. ⟨lirmm-00268536⟩

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