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Experimental test infrastructure supporting IEEE 11494 Standard

Abstract : The IEEE 1149 4 standard for a mixed-signal test bus (Dot4) [1], which addresses the application of boundary- scan test techniques in mixed analog / digital circuits, was adopted already in 1999 However, major electronic manufacturers, with few exceptions [2], do not seem very keen to include Dot4 support into their products It is our belief that wider acceptance of Dot 4 mixed-signal test bus will only come with the demonstration of its benefits in actual designs and the presentation of innovative and efficient applications of the Dot 4 infrastructure [3, 4] To support development and evaluation of Dot4 based test and measurement procedures we decided to design and implement a series of experimental Dot 4 chips to serve as technology demonstrator vehicles
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Contributor : Christine Carvalho de Matos <>
Submitted on : Saturday, January 21, 2017 - 7:12:06 PM
Last modification on : Monday, July 8, 2019 - 3:30:28 PM
Long-term archiving on: : Saturday, April 22, 2017 - 1:03:39 PM


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  • HAL Id : lirmm-00268606, version 1



Uroš Kač, Franc Novak, Jozef Stefan, Florence Azaïs, Pascal Nouet, et al.. Experimental test infrastructure supporting IEEE 11494 Standard. ETW: European Test Workshop, 2002, Corfou, Greece. ⟨lirmm-00268606⟩



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