An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles IEEE Design & Test Year : 2003
No file

Dates and versions

lirmm-00269822 , version 1 (03-04-2008)

Identifiers

Cite

Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test, 2003, 20 (1), pp.60-67. ⟨10.1109/MDT.2003.1173054⟩. ⟨lirmm-00269822⟩
56 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More