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An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269822
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:22:54 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00269822, version 1

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Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test, IEEE, 2003, 20 (1), pp.60-67. ⟨lirmm-00269822⟩

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