Low Power Testing

Abstract : Power dissipation has become a major design objective in many application areas, such as wireless communications and high performance computing, thus leading to the production of numerous low-power designs. At the same time, power dissipation is also becoming a critical parameter during manufacturing test, as the design can consume much more power during test than during functional mode of operation. Because test throughput and manufacturing yield are often affected by test power, dedicated test methodologies have emerged over the past decade. In this chapter, we discuss issues arising from excessive power consumption during test application as well as provide structural and algorithmic solutions that can be used to alleviate the low-power test problems. We first review some basic elements of power modeling and related terminologies. After discussing test power issues, promising low-power test techniques to deal with nanometer system-on-chip (SOC) designs are presented. These techniques can be broadly classified into those that apply during scan testing and those that apply during built-in self-test (BIST). A few of them are also applicable to test compression circuits or memory designs.
keyword : Test Low Power
Type de document :
Chapitre d'ouvrage
Morgan Kaufmann. System-on-Chip Test Architectures: Nanometer Design for Testability, pp.207-350, 2007, 978-0-12-373973-5
Liste complète des métadonnées

Littérature citée [82 références]  Voir  Masquer  Télécharger

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00326800
Contributeur : Patrick Girard <>
Soumis le : lundi 6 octobre 2008 - 08:45:38
Dernière modification le : jeudi 24 mai 2018 - 15:59:24
Document(s) archivé(s) le : vendredi 4 juin 2010 - 12:14:19

Fichier

Chapter07_final_DfTbook_Morgan...
Fichiers produits par l'(les) auteur(s)

Identifiants

  • HAL Id : lirmm-00326800, version 1

Collections

Citation

Patrick Girard, Xiaoqing Wen, Nur Touba. Low Power Testing. Morgan Kaufmann. System-on-Chip Test Architectures: Nanometer Design for Testability, pp.207-350, 2007, 978-0-12-373973-5. 〈lirmm-00326800〉

Partager

Métriques

Consultations de la notice

213

Téléchargements de fichiers

969