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DDECS'07: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

keyword : Test Diagnostic Design
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00326801
Contributor : Patrick Girard <>
Submitted on : Monday, October 6, 2008 - 9:00:31 AM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00326801, version 1

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Patrick Girard, Elena Gramatova, Adam Pawlak, Andrezw Krasniewski, Tomasz Garbolino. DDECS'07: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. IEEE Computer Society, pp.300, 2007, 1-4244-1161-0. ⟨lirmm-00326801⟩

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