Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2009

Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks

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lirmm-00367718 , version 1 (12-03-2009)

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  • HAL Id : lirmm-00367718 , version 1

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Florence Azaïs, Yves Bertrand, Michel Renovell. Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367718⟩
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