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Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks

Florence Azaïs 1 Yves Bertrand 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00367718
Contributor : Martine Peridier <>
Submitted on : Thursday, March 12, 2009 - 11:08:09 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00367718, version 1

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Florence Azaïs, Yves Bertrand, Michel Renovell. Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367718⟩

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