Skip to Main content Skip to Navigation
Conference papers

The future of Embedded Test within the Design for Micro & Nano Manufacture NoE

Pascal Nouet 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406909
Contributor : Lionel Torres <>
Submitted on : Thursday, July 23, 2009 - 4:00:09 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

Identifiers

  • HAL Id : lirmm-00406909, version 1

Collections

Citation

Pascal Nouet. The future of Embedded Test within the Design for Micro & Nano Manufacture NoE. Workshop on Design for Reliability and Manufacturability in MNT, Italy. ⟨lirmm-00406909⟩

Share

Metrics

Record views

40