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Conference Papers Year : 2007

The future of Embedded Test within the Design for Micro & Nano Manufacture NoE

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lirmm-00406909 , version 1 (23-07-2009)

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  • HAL Id : lirmm-00406909 , version 1

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Pascal Nouet. The future of Embedded Test within the Design for Micro & Nano Manufacture NoE. Workshop on Design for Reliability and Manufacturability in MNT, Apr 2006, Stresa, Lago Maggiore, Italy. ⟨lirmm-00406909⟩
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