Challenges in MEMS Manufacture Testing and Embedded Test Solutions

Pascal Nouet 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406914
Contributor : Lionel Torres <>
Submitted on : Thursday, July 23, 2009 - 4:06:39 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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Pascal Nouet. Challenges in MEMS Manufacture Testing and Embedded Test Solutions. NTC (Northern Test Center) Remote and Embedded Testing Seminar, Finland. ⟨lirmm-00406914⟩

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