Challenges in MEMS Manufacture Testing and Embedded Test Solutions - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2007

Challenges in MEMS Manufacture Testing and Embedded Test Solutions

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lirmm-00406914 , version 1 (23-07-2009)

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  • HAL Id : lirmm-00406914 , version 1

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Pascal Nouet. Challenges in MEMS Manufacture Testing and Embedded Test Solutions. NTC (Northern Test Center) Remote and Embedded Testing Seminar, Finland. ⟨lirmm-00406914⟩
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