NAND Flash Testing: A Preliminary Study on Actual Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2009

NAND Flash Testing: A Preliminary Study on Actual Defects

Abstract

Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.
No file

Dates and versions

lirmm-00433765 , version 1 (20-11-2009)

Identifiers

Cite

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. NAND Flash Testing: A Preliminary Study on Actual Defects. ITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩. ⟨lirmm-00433765⟩
96 View
0 Download

Altmetric

Share

Gmail Mastodon Facebook X LinkedIn More