NAND Flash Testing: A Preliminary Study on Actual Defects

Abstract : Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.
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Poster communications
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00433765
Contributor : Arnaud Virazel <>
Submitted on : Friday, November 20, 2009 - 10:42:24 AM
Last modification on : Friday, August 30, 2019 - 10:50:52 AM

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Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. NAND Flash Testing: A Preliminary Study on Actual Defects. ITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩. ⟨lirmm-00433765⟩

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