NAND Flash Testing: A Preliminary Study on Actual Defects

Abstract : Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.
Type de document :
Poster
ITC'2009: International Test Conference, Nov 2009, Austin, Texas, United States. pp.13, 2009
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00433765
Contributeur : Arnaud Virazel <>
Soumis le : vendredi 20 novembre 2009 - 10:42:24
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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  • HAL Id : lirmm-00433765, version 1

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Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. NAND Flash Testing: A Preliminary Study on Actual Defects. ITC'2009: International Test Conference, Nov 2009, Austin, Texas, United States. pp.13, 2009. 〈lirmm-00433765〉

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