Dependability: A Challenge for Electrical Medical Implant

Fanny Le Floch 1 Guy Cathébras 1 Serge Bernard 1 Fabien Soulier 1
1 DEMAR - Artificial movement and gait restoration
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, CRISAM - Inria Sophia Antipolis - Méditerranée
Abstract : Functional Electrical Stimulation (FES) is an attractive solution to restore some lost or failing physiological functions. Obviously, the FES system may be hazardous for patient and the reliability and dependability of the system must be maximal. Unfortunately, the present context, where the associated systems are more and more complex and their development needs very cross-disciplinary experts, is not favorable to safety. Moreover, the direct adaptation of the existing dependability techniques from domains such as space or automotive is not suitable. Firstly, this paper proposes a strategy for risk management at system level for FES medical implant. The idea is to give a uniform framework where all possible hazards are highlighted and associated consequences are minimized. Then, the paper focuses on critical parts of the FES system: analog micro-circuit which generates the electrical signal to electrode. As this micro-circuit is the closest to the human tissue, any failure might involve very critical consequences for the patient. We propose a concurrent top-down and bottom-up approach where the critical elements are highlighted and an extended risk analysis is performed.
Type de document :
Communication dans un congrès
32nd Annual International IEEE EMBS Conference, Aug 2010, Buenos Aires, Argentina. pp.4, 2010, 〈http://embc2010.embs.org/〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00506114
Contributeur : Guy Cathébras <>
Soumis le : mardi 27 juillet 2010 - 11:40:15
Dernière modification le : jeudi 11 janvier 2018 - 16:22:43

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  • HAL Id : lirmm-00506114, version 1

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Fanny Le Floch, Guy Cathébras, Serge Bernard, Fabien Soulier. Dependability: A Challenge for Electrical Medical Implant. 32nd Annual International IEEE EMBS Conference, Aug 2010, Buenos Aires, Argentina. pp.4, 2010, 〈http://embc2010.embs.org/〉. 〈lirmm-00506114〉

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