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Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553989
Contributor : Martine Peridier <>
Submitted on : Monday, January 10, 2011 - 12:01:25 PM
Last modification on : Wednesday, January 29, 2020 - 12:50:02 PM

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  • HAL Id : lirmm-00553989, version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France. ⟨lirmm-00553989⟩

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