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Poster communications

Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs

Sandra Irobi 1 Zaid Al-Ars 1 Said Hamdioui 1 Michel Renovell 2
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Document type :
Poster communications
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00591995
Contributor : Martine Peridier <>
Submitted on : Tuesday, May 10, 2011 - 4:43:44 PM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00591995, version 1

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Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Michel Renovell. Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs. DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Germany. pp.159-162, 2011. ⟨lirmm-00591995⟩

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