Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2011
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lirmm-00591995 , version 1 (10-05-2011)

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Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Michel Renovell. Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs. DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Germany. pp.159-162, 2011. ⟨lirmm-00591995⟩
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