Variability Analysis of an SRAM Test Chip - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2011

Variability Analysis of an SRAM Test Chip

Domains

Micro and nanotechnologies/Microelectronics

Martine Peridier  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651791

Submitted on : Wednesday, December 14, 2011-11:21:53 AM

Last modification on : Friday, March 24, 2023-2:52:55 PM

No file

Dates and versions

lirmm-00651791 , version 1 (14-12-2011)

Identifiers

  • HAL Id : lirmm-00651791 , version 1

Cite

Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Variability Analysis of an SRAM Test Chip. ETS: European Test Symposium, May 2011, Trondheim, Norway. ⟨lirmm-00651791⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
84 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More