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Conference Papers Year : 2011

Variability Analysis of an SRAM Test Chip

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lirmm-00651791 , version 1 (14-12-2011)

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  • HAL Id : lirmm-00651791 , version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Variability Analysis of an SRAM Test Chip. ETS: European Test Symposium, May 2011, Trondheim, Norway. ⟨lirmm-00651791⟩
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