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Variability Analysis of an SRAM Test Chip

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651791
Contributor : Martine Peridier <>
Submitted on : Wednesday, December 14, 2011 - 11:21:53 AM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00651791, version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Variability Analysis of an SRAM Test Chip. ETS: European Test Symposium, May 2011, Trondheim, Norway. ⟨lirmm-00651791⟩

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