https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651791 Contributor : Martine PeridierConnect in order to contact the contributor Submitted on : Wednesday, December 14, 2011 - 11:21:53 AM Last modification on : Friday, August 5, 2022 - 10:48:06 AM
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Variability Analysis of an SRAM Test Chip. ETS: European Test Symposium, May 2011, Trondheim, Norway. ⟨lirmm-00651791⟩