Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2011

Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs

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lirmm-00679494 , version 1 (15-03-2012)

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  • HAL Id : lirmm-00679494 , version 1

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Arnaud Virazel. Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs. NVM'11: Leading-Edge Embedded NVM Workshop, Gardane, France. ⟨lirmm-00679494⟩
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