Conference Papers
Year : 2011
Martine Peridier : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679494
Submitted on : Thursday, March 15, 2012-5:11:34 PM
Last modification on : Friday, March 24, 2023-2:52:55 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00679494 , version 1
Cite
Arnaud Virazel. Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs. NVM'11: Leading-Edge Embedded NVM Workshop, Gardane, France. ⟨lirmm-00679494⟩
47
View
0
Download