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Conference Papers Year : 2011

A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits

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lirmm-00679513 , version 1 (15-03-2012)

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  • HAL Id : lirmm-00679513 , version 1

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Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits. GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France. ⟨lirmm-00679513⟩
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