Today's deeply-scaled technology-based integrated circuits are highly sensitive to soft error, tending to be even more in the future. In fact, emerging critical issues are related to transient faults that now can be as long as circuits' clock periods. This work presents a novel improved strategy based on bulk built-in current sensors that is able to cope with long-duration transient faults. Our cost-effective approach is a concurrent error detection scheme with recovery procedure, and rather than existing similar strategy, it has faster correction latency and uses less recovery resources.