A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies

Rodrigo Possamai Bastos 1, * Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
* Auteur correspondant
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Today's deeply-scaled technology-based integrated circuits are highly sensitive to soft error, tending to be even more in the future. In fact, emerging critical issues are related to transient faults that now can be as long as circuits' clock periods. This work presents a novel improved strategy based on bulk built-in current sensors that is able to cope with long-duration transient faults. Our cost-effective approach is a concurrent error detection scheme with recovery procedure, and rather than existing similar strategy, it has faster correction latency and uses less recovery resources.
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Communication dans un congrès
IEEE. DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, 2011, 〈http://www.dfts.org/〉. 〈10.1109/DFT.2011.15〉
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Contributeur : Rodrigo Possamai Bastos <>
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Dernière modification le : jeudi 11 janvier 2018 - 06:27:19
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Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies. IEEE. DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, 2011, 〈http://www.dfts.org/〉. 〈10.1109/DFT.2011.15〉. 〈lirmm-00701789〉

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