Embedding Statistical Tests for On-Chip Dynamic Voltage and Temperature Monitoring

Abstract : All mobile applications require high performances with very long battery life. The speed and power consumption trade-off clearly appears as a prominent challenge to optimize the overall energy efficiency. In MultiProcessor System-On-Chip architectures, the trade-off is usually achieved by dynamically adapting the supply voltage and the operating frequency of a processor cluster or of each processor at fine grain. This requires monitoring accurately, on-chip and at runtime, the supply voltage and temperature across the die. Within this context, this paper introduces a method to es-timate, from on-chip measurements, using embedded statistical tests, the supply voltage and temperature of small die area using low-cost digital sensors featuring a set of ring oscillators solely. The results obtained, considering a 32nm process, demonstrate the efficiency of the proposed method. Indeed, voltage and temperature measurement errors are kept, in average, below 5mV and 7°C, respectively.
Type de document :
Communication dans un congrès
DAC: Design Automation Conference, Jun 2012, San Francisco, CA, United States. 49th Design Automation Conference, pp.994-999, 2012, 〈https://dac.com/content/49th-dac〉
Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00762020
Contributeur : Philippe Maurine <>
Soumis le : jeudi 6 décembre 2012 - 12:50:43
Dernière modification le : jeudi 24 mai 2018 - 15:59:24

Identifiants

  • HAL Id : lirmm-00762020, version 1

Collections

Citation

Philippe Maurine, Lionel Vincent, Suzanne Lesecq, Edith Beigné. Embedding Statistical Tests for On-Chip Dynamic Voltage and Temperature Monitoring. DAC: Design Automation Conference, Jun 2012, San Francisco, CA, United States. 49th Design Automation Conference, pp.994-999, 2012, 〈https://dac.com/content/49th-dac〉. 〈lirmm-00762020〉

Partager

Métriques

Consultations de la notice

71