Smart selection of indirect parameters for DC-based alternate RF IC testing

Haithem Ayari 1 Florence Azaïs 2 Serge Bernard 3 Mariane Comte 2 Michel Renovell 2 Vincent Kerzérho 2 Olivier Potin 1 Christophe Kelma 4
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 DEMAR - Artificial movement and gait restoration
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, CRISAM - Inria Sophia Antipolis - Méditerranée
Abstract : In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC parameters is presented, that allows precise estimation of the DUT performances while minimizing the number of measurements to be carried out. The method is demonstrated both on simulation test data from a Low-Noise Amplifier (LNA) and production test data from a Power Amplifier (PA). Results indicate that good prediction of the RF performances can be achieved using only a reduced number of DC measurements.
Type de document :
Communication dans un congrès
VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. IEEE, pp.19-24, 2012, 〈10.1109/VTS.2012.6231074〉
Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00803453
Contributeur : Florence Azais <>
Soumis le : vendredi 22 mars 2013 - 09:27:50
Dernière modification le : jeudi 11 janvier 2018 - 16:59:55

Identifiants

Citation

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, et al.. Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. IEEE, pp.19-24, 2012, 〈10.1109/VTS.2012.6231074〉. 〈lirmm-00803453〉

Partager

Métriques

Consultations de la notice

191