Smart selection of indirect parameters for DC-based alternate RF IC testing
Abstract
In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC parameters is presented, that allows precise estimation of the DUT performances while minimizing the number of measurements to be carried out. The method is demonstrated both on simulation test data from a Low-Noise Amplifier (LNA) and production test data from a Power Amplifier (PA). Results indicate that good prediction of the RF performances can be achieved using only a reduced number of DC measurements.
Keywords
power amplifiers
radiofrequency integrated circuits
DC measurement
DC-based alternate RFIC testing
DUT performance
LNA
low-noise amplifier
power amplifier
production test data
simulation test data
smart selection
Accuracy
Context
Performance evaluation
Production
Radio frequency
Semiconductor device measurement
Testing
DC measurements
RF integrated circuits
Test
alternate test
test compaction
Mots-clés : integrated circuit testing
low noise amplifiers