Smart selection of indirect parameters for DC-based alternate RF IC testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2012

Smart selection of indirect parameters for DC-based alternate RF IC testing

Abstract

In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC parameters is presented, that allows precise estimation of the DUT performances while minimizing the number of measurements to be carried out. The method is demonstrated both on simulation test data from a Low-Noise Amplifier (LNA) and production test data from a Power Amplifier (PA). Results indicate that good prediction of the RF performances can be achieved using only a reduced number of DC measurements.
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lirmm-00803453 , version 1 (22-03-2013)

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Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, et al.. Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩. ⟨lirmm-00803453⟩
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