Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor

We simulate atmospheric neutron-induced transient current on a 45-nm technology electrode. We propose an empirical law expressing the probability of obtaining a given transient with a given collected charge and a given pulse width.

Mots clés

SRAM MC-ORACLE Neutrons Soft Errors

Domaines

Electronique

Luigi Dilillo : Connectez-vous pour contacter le contributeur

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805275

Soumis le : mercredi 27 mars 2013-15:05:04

Dernière modification le : vendredi 24 mars 2023-14:52:56

Dates et versions

lirmm-00805275 , version 1 (27-03-2013)

Identifiants

HAL Id : lirmm-00805275 , version 1

Citer

Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Jean-Roch Vaillé, Frédéric Saigné. Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4. ⟨lirmm-00805275⟩

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