Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor

We simulate atmospheric neutron-induced transient current on a 45-nm technology electrode. We propose an empirical law expressing the probability of obtaining a given transient with a given collected charge and a given pulse width.

Keywords

SRAM MC-ORACLE Neutrons Soft Errors

Domains

Electronics

Luigi Dilillo : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805275

Submitted on : Wednesday, March 27, 2013-3:05:04 PM

Last modification on : Friday, March 24, 2023-2:52:56 PM

Dates and versions

lirmm-00805275 , version 1 (27-03-2013)

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HAL Id : lirmm-00805275 , version 1

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Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Jean-Roch Vaillé, Frédéric Saigné. Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4. ⟨lirmm-00805275⟩

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