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Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor

Frédéric Wrobel 1 Luigi Dilillo 2 Antoine Touboul 3, 1 Jean-Roch Vaillé 3, 1 Frédéric Saigné 1
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 RADIAC - Radiations et composants
IES - Institut d’Electronique et des Systèmes
Abstract : We simulate atmospheric neutron-induced transient current on a 45-nm technology electrode. We propose an empirical law expressing the probability of obtaining a given transient with a given collected charge and a given pulse width.
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805275
Contributor : Luigi Dilillo <>
Submitted on : Wednesday, March 27, 2013 - 3:05:04 PM
Last modification on : Thursday, January 23, 2020 - 4:28:09 PM

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  • HAL Id : lirmm-00805275, version 1

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Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Jean-Roch Vaillé, Frédéric Saigné. Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4. ⟨lirmm-00805275⟩

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