Keynote intitulé "Power : The New Dimension of Test"

Patrick Girard

Conference Papers Year : 2008

Keynote intitulé "Power : The New Dimension of Test"

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Patrick Girard

Function : Author
PersonId : 740458
IdHAL : patrick-girard-lirmm
ORCID : 0000-0003-0722-8772

Conception et Test de Systèmes MICroélectroniques

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Micro and nanotechnologies/Microelectronics

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Girard_WRTLT08.pdf (599.53 Ko)

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00820640

Submitted on : Monday, May 6, 2013-12:35:26 PM

Last modification on : Friday, March 24, 2023-2:52:57 PM

Long-term archiving on: Monday, August 19, 2013-3:20:38 PM

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lirmm-00820640 , version 1 (06-05-2013)

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HAL Id : lirmm-00820640 , version 1

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Patrick Girard. Keynote intitulé "Power : The New Dimension of Test". WRTLT'2008: Workshop on RTL and High Level Testing, Nov 2008, Sapporo, Japan. ⟨lirmm-00820640⟩

Keynote intitulé "Power : The New Dimension of Test"

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