Power-Aware Testing and Test Strategies for Low Power Devices - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2011

Power-Aware Testing and Test Strategies for Low Power Devices

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Micro and nanotechnologies/Microelectronics
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00820698

Submitted on : Monday, May 6, 2013-2:37:31 PM

Last modification on : Tuesday, October 15, 2024-3:03:32 PM

Long-term archiving on : Monday, August 19, 2013-3:25:39 PM

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lirmm-00820698 , version 1 (06-05-2013)

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  • HAL Id : lirmm-00820698 , version 1

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Patrick Girard, Nicola Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. DATE: Design, Automation and Test in Europe, Mar 2011, Grenoble, France. ⟨lirmm-00820698⟩

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