Stochastic model for phase noise measurement from 1-bit signal acquisition - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2014

Stochastic model for phase noise measurement from 1-bit signal acquisition

Abstract

This paper presents a novel method for phase noise measurement from 1-bit acquisition of an analog signal. A stochastic model is developed that permits to establish an analytical relationship between the phase noise level present in the analog signal and the characteristics of the binary data captured with a digital ATE. The technique is validated through both simulations and hardware measurements.
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lirmm-01119368 , version 1 (23-02-2015)

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Stéphane David-Grignot, Florence Azaïs, François Lefevre, Laurent Latorre. Stochastic model for phase noise measurement from 1-bit signal acquisition. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. ⟨10.1109/IMS3TW.2014.6997400⟩. ⟨lirmm-01119368⟩
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