Toward adaptation of ADCs to operating conditions through on-chip correction

Vincent Kerzérho 1 Ludovic Guillaume-Sage 1 Florence Azaïs 2 Mariane Comte 2 Michel Renovell 2 Serge Bernard 1
1 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper discusses the need for on-chip correction of mixed-signal integrated circuits, and particularly Analog-to-Digital Converters (ADCs), for in-situ adaptation to the operating conditions. By operating conditions, we mean the environmental conditions and the electrical settings applied to the ADC by the complex system in which it is implemented. This discussion is supported by experimental measurements of the impact of temperature and sampling frequency on the non-linearity of the ADC and its correction using a so-called LUT-based (Look-Up Table) correction technique. These experimental results enlighten the need for in-situ correction and an architectural solution is presented. The feasibility of this solution is discussed in terms of silicon area overhead and LUT-filling time.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01233117
Contributor : Florence Azais <>
Submitted on : Tuesday, November 24, 2015 - 3:06:11 PM
Last modification on : Wednesday, August 28, 2019 - 7:12:02 PM

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Vincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, et al.. Toward adaptation of ADCs to operating conditions through on-chip correction. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩. ⟨lirmm-01233117⟩

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