Toward adaptation of ADCs to operating conditions through on-chip correction

Abstract : This paper discusses the need for on-chip correction of mixed-signal integrated circuits, and particularly Analog-to-Digital Converters (ADCs), for in-situ adaptation to the operating conditions. By operating conditions, we mean the environmental conditions and the electrical settings applied to the ADC by the complex system in which it is implemented. This discussion is supported by experimental measurements of the impact of temperature and sampling frequency on the non-linearity of the ADC and its correction using a so-called LUT-based (Look-Up Table) correction technique. These experimental results enlighten the need for in-situ correction and an architectural solution is presented. The feasibility of this solution is discussed in terms of silicon area overhead and LUT-filling time.
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Communication dans un congrès
ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. Proc. IEEE Computer Society Annual Symposium on VLSI (ISVLSI’15), pp.634-639, 2015, 〈10.1109/ISVLSI.2015.62〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01233117
Contributeur : Florence Azais <>
Soumis le : mardi 24 novembre 2015 - 15:06:11
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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Vincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, et al.. Toward adaptation of ADCs to operating conditions through on-chip correction. ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. Proc. IEEE Computer Society Annual Symposium on VLSI (ISVLSI’15), pp.634-639, 2015, 〈10.1109/ISVLSI.2015.62〉. 〈lirmm-01233117〉

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