A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Abstract : A methodology is proposed to perform statistical analysis of radiation test data of memories searching for trends in the error distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.
Keywords : Memories MCU SER Bitmap SEU
Type de document :
Communication dans un congrès
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. 15th European Conference on Radiation and Its Effects on Components and Systems, 2015, 〈http://www.radecs2015.org/files/CONFERENCE_PROGRAM.pdf〉. 〈10.1109/RADECS.2015.7365578〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01238397
Contributeur : Luigi Dilillo <>
Soumis le : vendredi 4 décembre 2015 - 18:08:06
Dernière modification le : jeudi 11 janvier 2018 - 06:27:29

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Alexandre Bosser, Viyas Gupta, Georgios Tsiligiannis, Rudy Ferraro, Christopher Frost, et al.. A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. 15th European Conference on Radiation and Its Effects on Components and Systems, 2015, 〈http://www.radecs2015.org/files/CONFERENCE_PROGRAM.pdf〉. 〈10.1109/RADECS.2015.7365578〉. 〈lirmm-01238397〉

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