A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2015

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Ali Mohammadzadeh
  • Function : Author
Arto Javanainen
  • Function : Author
Helmut Puchner
Mario Rossi
  • Function : Author
Frédéric Saigné
Ari Virtanen
  • Function : Author

Abstract

A methodology is proposed to perform statistical analysis of radiation test data of memories searching for trends in the error distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.

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Electronics
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Dates and versions

lirmm-01238397 , version 1 (04-12-2015)

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Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Rudy Ferraro, Christopher Frost, et al.. A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩. ⟨lirmm-01238397⟩
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