A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Abstract : A methodology is proposed to perform statistical analysis of radiation test data of memories searching for trends in the error distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.
Keywords : Memories MCU SER Bitmap SEU
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01238397
Contributor : Luigi Dilillo <>
Submitted on : Friday, December 4, 2015 - 6:08:06 PM
Last modification on : Monday, July 1, 2019 - 10:28:03 AM

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Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Rudy Ferraro, Christopher Frost, et al.. A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩. ⟨lirmm-01238397⟩

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