Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Alexandre Louis Bosser; Luigi Dilillo; Viyas Gupta; Arto Javanainen; Heikki Kettunen; Mario Rossi; Georgios Tsiligiannis; Ari Virtanen

Conference papers

Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Alexandre Louis Bosser Luigi Dilillo ¹ Viyas Gupta Arto Javanainen ² Heikki Kettunen ² Mario Rossi Georgios Tsiligiannis ¹ Ari Virtanen

1 SysMIC - Conception et Test de Systèmes MICroélectroniques

LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier

2 JYU - University of Jyväskylä

Abstract : In this work the heavy ion induced Single Event Upset (SEU) cross-sections and resulting failure rates of SRAM memory components were studied.

Keywords : SRAM Heavy ions Cross section SEU

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Electronics

Physics [physics]

Complete list of metadata

Cited literature [2 references] Display Hide Download

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01238439
Contributor : Luigi Dilillo <>
Submitted on : Monday, July 22, 2019 - 12:01:17 PM
Last modification on : Saturday, November 28, 2020 - 10:10:47 AM

Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

File

Identifiers

Collections

Citation

Export

Metrics

265

32

Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

File

Identifiers

Collections

Citation

Export

Share

Metrics

265

32