Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Alexandre Bosser Luigi Dilillo 1 Viyas Gupta Arto Javanainen Heikki Kettunen Mario Rossi Georgios Tsiligiannis 1 Ari Virtanen
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this work the heavy ion induced Single Event Upset (SEU) cross-sections and resulting failure rates of SRAM memory components were studied.
Keywords : SEU Cross section Heavy ions SRAM
Type de document :
Communication dans un congrès
Physics Days: Annual Meeting of the Finnish Physical Society, Mar 2014, Tampere, Finland. Physics Days 2014, the 48th Annual Meeting of the Finnish Physical Society, is organized in Tampere Hall - the largest congress center in Nordic countries - on March 11-13, 2014, 2014, 〈http://webhotel2.tut.fi/fys/physicsdays/〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01238439
Contributeur : Luigi Dilillo <>
Soumis le : vendredi 4 décembre 2015 - 21:27:15
Dernière modification le : jeudi 28 juin 2018 - 18:44:03

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  • HAL Id : lirmm-01238439, version 1

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SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | TEST

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Alexandre Bosser, Luigi Dilillo, Viyas Gupta, Arto Javanainen, Heikki Kettunen, et al.. Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components. Physics Days: Annual Meeting of the Finnish Physical Society, Mar 2014, Tampere, Finland. Physics Days 2014, the 48th Annual Meeting of the Finnish Physical Society, is organized in Tampere Hall - the largest congress center in Nordic countries - on March 11-13, 2014, 2014, 〈http://webhotel2.tut.fi/fys/physicsdays/〉. 〈lirmm-01238439〉

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