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Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Alexandre Louis Bosser Luigi Dilillo 1 Viyas Gupta Arto Javanainen Heikki Kettunen Mario Rossi Georgios Tsiligiannis 1 Ari Virtanen
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this work the heavy ion induced Single Event Upset (SEU) cross-sections and resulting failure rates of SRAM memory components were studied.
Keywords : SRAM Heavy ions Cross section SEU
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01238439
Contributor : Luigi Dilillo <>
Submitted on : Monday, July 22, 2019 - 12:01:17 PM
Last modification on : Monday, July 22, 2019 - 12:02:33 PM

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LIRMM | CNRS | SYSMIC | TEST | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

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Alexandre Louis Bosser, Luigi Dilillo, Viyas Gupta, Arto Javanainen, Heikki Kettunen, et al.. Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components. Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland. ⟨lirmm-01238439⟩

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