Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2014

Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Alexandre Louis Bosser
Viyas Gupta
  • Function : Author
  • PersonId : 1231992
Mario Rossi
  • Function : Author
Ari Virtanen
  • Function : Author

Abstract

In this work the heavy ion induced Single Event Upset (SEU) cross-sections and resulting failure rates of SRAM memory components were studied.
Fichier principal
Vignette du fichier
Physics Days_2014.pdf (67.5 Ko) Télécharger le fichier
Origin Files produced by the author(s)
Loading...

Dates and versions

lirmm-01238439 , version 1 (22-07-2019)

Identifiers

  • HAL Id : lirmm-01238439 , version 1

Cite

Alexandre Louis Bosser, Luigi Dilillo, Viyas Gupta, Arto Javanainen, Heikki Kettunen, et al.. Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components. Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland. ⟨lirmm-01238439⟩
167 View
46 Download

Share

Gmail Mastodon Facebook X LinkedIn More