Test and diagnosis of power switches

Abstract : Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a functional block of the IC. In this paper we present a novel Design for Test & Diagnosis to increase the test quality and diagnosis accuracy of power switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits.
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Communication dans un congrès
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.213-218, 2014, 〈10.1109/DDECS.2014.6868792〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248590
Contributeur : Aida Todri-Sanial <>
Soumis le : dimanche 27 décembre 2015 - 21:41:24
Dernière modification le : vendredi 2 mars 2018 - 19:36:02

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Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, et al.. Test and diagnosis of power switches. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.213-218, 2014, 〈10.1109/DDECS.2014.6868792〉. 〈lirmm-01248590〉

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