An intra-cell defect grading tool

Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Aida Todri-Sanial 2 Stefano Bernabovi 3 Paolo Bernardi 3
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : With the continuous scaling down of the transistor size, the so-called intra-cell defects are more and more frequent. In this paper we propose a defect grading tool able to evaluate the efficiency of the applied test set. The test set efficiency is quantified w.r.t. the intra-cell defect coverage and the intra-cell diagnosis resolution.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248591
Contributor : Aida Todri-Sanial <>
Submitted on : Sunday, December 27, 2015 - 9:41:25 PM
Last modification on : Wednesday, May 8, 2019 - 2:56:01 PM

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Stefano Bernabovi, et al.. An intra-cell defect grading tool. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩. ⟨lirmm-01248591⟩

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