On the Generation of Diagnostic Test Set for Intra-cell Defects

Abstract : In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.
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Communication dans un congrès
ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. Test Symposium (ATS), 2014 IEEE 23rd Asian, pp.312-317, 2014, 〈10.1109/ATS.2014.57〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01272539
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Soumis le : mardi 15 mars 2016 - 11:13:32
Dernière modification le : jeudi 28 juin 2018 - 18:44:02

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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. On the Generation of Diagnostic Test Set for Intra-cell Defects. ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. Test Symposium (ATS), 2014 IEEE 23rd Asian, pp.312-317, 2014, 〈10.1109/ATS.2014.57〉. 〈lirmm-01272539〉

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