On the Generation of Diagnostic Test Set for Intra-cell Defects

Abstract : In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01272539
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Submitted on : Tuesday, March 15, 2016 - 11:13:32 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. On the Generation of Diagnostic Test Set for Intra-cell Defects. ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩. ⟨lirmm-01272539⟩

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