Test of Low Power Circuits: Issues and Industrial Practices

Alberto Bosio 1 Patrick Girard 1 Arnaud Virazel 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Contributor : Arnaud Virazel <>
Submitted on : Thursday, January 12, 2017 - 3:52:18 PM
Last modification on : Friday, March 22, 2019 - 3:12:02 PM

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Alberto Bosio, Patrick Girard, Arnaud Virazel. Test of Low Power Circuits: Issues and Industrial Practices. ICECS: International Conference on Electronics, Circuits and Systems, Dec 2016, Monte Carlo, Monaco. ⟨lirmm-01433330⟩

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