Test of Low Power Circuits: Issues and Industrial Practices - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2016
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lirmm-01433330 , version 1 (12-01-2017)

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  • HAL Id : lirmm-01433330 , version 1

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Alberto Bosio, Patrick Girard, Arnaud Virazel. Test of Low Power Circuits: Issues and Industrial Practices. ICECS: International Conference on Electronics, Circuits and Systems, Dec 2016, Monte Carlo, Monaco. ⟨lirmm-01433330⟩
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