Books Year : 2013

Proceedings of the 18th IEEE European Test Symposium (ETS 2013) - May 27-30, 2013 - Avignon, France

Patrick Girard
Conception et Test de Systèmes MICroélectroniques
CV
Sybille Hellebrand
  • Function : Scientific advisor
University of Paderborn
Zebo Peng
  • Function : Scientific advisor
Linköping University
Matteo Sonza Reorda
Politecnico di Torino = Polytechnic of Turin
Giorgio Di Natale
Conception et Test de Systèmes MICroélectroniques
CV

Abstract

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics and new trends in the area of electronic-based circuits and system testing. In 2013 ETS will take place in the Congress Center of the Popes’ Palace in the beautiful city of Avignon, France

Domains

Micro and nanotechnologies/Microelectronics

Caroline Lebrun  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01433571

Submitted on : Thursday, January 12, 2017-5:12:47 PM

Last modification on : Friday, March 24, 2023-2:53:03 PM

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Dates and versions

lirmm-01433571 , version 1 (12-01-2017)

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  • HAL Id : lirmm-01433571 , version 1

Cite

Patrick Girard, Sybille Hellebrand, Zebo Peng, Matteo Sonza Reorda, Giorgio Di Natale (Dir.). Proceedings of the 18th IEEE European Test Symposium (ETS 2013) - May 27-30, 2013 - Avignon, France. IEEE, 2013, 978-1-4673-6375-4. ⟨lirmm-01433571⟩

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