Valentin Gherman, Emna Farjallah, Jean-Marc Armani, Marcelino Seif, Luigi Dilillo. Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics.
ITC: International Test Conference, Oct 2017, Fort Worth, United States.
⟨10.1109/TEST.2017.8242066⟩.
⟨lirmm-01582185⟩