Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits - Archive ouverte HAL Access content directly
Conference Papers Year : 2018

Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits

(1) , (2) , (1) , (3)
1
2
3

Abstract

Designing secure integrated systems requires methods and tools dedicated to simulating that early design stages' the effects of laser-induced transient faults maliciously injected by attackers. Existing methods for simulation of laser-induced transient faults do not take into account IR drop effects that are able to cause timing failures, abnormal reset, and SRAM flipping. This paper proposes a novel standard CAD tool-based method allowing to simulate laser-induced faults in large-scale circuits. Thanks to a power-grid network modeled by a commercial IR drop CAD tool, an additional transient current component causing laser-induced IR drop is taken into consideration. This current component flows from Vdd to Gnd and may have a significant effect on the fault injection process. The method provides fault sensitivity maps that enable a quick assessment of laser-induced fault effects on the circuit under analysis. As shown in the results, the number of induced faults is underestimated by a factor as large as 3.1 if laser-induced IR drop is ignored. This may lead to incorrect estimations of the fault injection threshold, which is especially relevant for the design of countermeasure techniques for secure integrated systems. Simulation times regarding four different circuits are also presented in the results section.
Fichier principal
Vignette du fichier
viera2018.pdf (1.85 Mo) Télécharger le fichier
Vignette du fichier
ISPD_2018.pdf (4.74 Mo) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

lirmm-01743368 , version 1 (31-03-2022)

Identifiers

Cite

Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos. Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits. ISPD 2018 - International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167, ⟨10.1145/3177540.3178243⟩. ⟨lirmm-01743368⟩
200 View
20 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More