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Conference Poster Year : 2017

Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits

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lirmm-01892667 , version 1 (10-10-2018)

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  • HAL Id : lirmm-01892667 , version 1

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Mathieu da Silva, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits. SETS: South European Test Seminar, Mar 2017, Alpe d'Huez, France. , 2017. ⟨lirmm-01892667⟩
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