Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits

Mathieu da Silva 1 Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Submitted on : Wednesday, October 10, 2018 - 5:46:28 PM
Last modification on : Wednesday, May 8, 2019 - 2:56:02 PM

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Mathieu da Silva, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits. SETS: South European Test Seminar, Mar 2017, Alpe d'Huez, France. 2017. ⟨lirmm-01892667⟩

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