Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source

Leonardo B. Zordan 1 Patrick Girard 2 Alberto Bosio 2 Nabil Badereddine 1
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089895
Contributor : Arnaud Virazel <>
Submitted on : Thursday, April 4, 2019 - 11:43:09 AM
Last modification on : Wednesday, September 4, 2019 - 1:40:02 PM

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  • HAL Id : lirmm-02089895, version 1

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Leonardo B. Zordan, Patrick Girard, Alberto Bosio, Nabil Badereddine. Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source. France, Patent n° : US20140307515. 2013. ⟨lirmm-02089895⟩

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