Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Patents Year : 2013

Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source

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Dates and versions

lirmm-02089895 , version 1 (04-04-2019)

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  • HAL Id : lirmm-02089895 , version 1

Cite

Leonardo B. Zordan, Patrick Girard, Alberto Bosio, Nabil Badereddine. Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source. France, Patent n° : US20140307515. 2013. ⟨lirmm-02089895⟩
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