Assist Circuits for SRAM Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Patents Year : 2014
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Dates and versions

lirmm-02089903 , version 1 (04-04-2019)

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  • HAL Id : lirmm-02089903 , version 1

Cite

Nabil Badereddine, Leonardo B. Zordan, Patrick Girard, Alberto Bosio. Assist Circuits for SRAM Testing. France, Patent n° : US9418759. 2014. ⟨lirmm-02089903⟩
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