Assist Circuits for SRAM Testing

Nabil Badereddine 1 Leonardo B. Zordan 1 Patrick Girard 2 Alberto Bosio 2
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089903
Contributor : Arnaud Virazel <>
Submitted on : Thursday, April 4, 2019 - 11:45:47 AM
Last modification on : Wednesday, August 28, 2019 - 4:02:58 PM

Identifiers

  • HAL Id : lirmm-02089903, version 1

Collections

Citation

Nabil Badereddine, Leonardo B. Zordan, Patrick Girard, Alberto Bosio. Assist Circuits for SRAM Testing. France, Patent n° : US9418759. 2014. ⟨lirmm-02089903⟩

Share

Metrics

Record views

37