Assist Circuits for SRAM Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Patents Year : 2014

Assist Circuits for SRAM Testing

Domains

Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089903

Submitted on : Thursday, April 4, 2019-11:45:47 AM

Last modification on : Friday, March 24, 2023-2:53:10 PM

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Dates and versions

lirmm-02089903 , version 1 (04-04-2019)

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  • HAL Id : lirmm-02089903 , version 1

Cite

Nabil Badereddine, Leonardo B. Zordan, Patrick Girard, Alberto Bosio. Assist Circuits for SRAM Testing. France, Patent n° : US9418759. 2014. ⟨lirmm-02089903⟩

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CNRS LIRMM TEST LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
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