https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089903 Contributor : Arnaud VirazelConnect in order to contact the contributor Submitted on : Thursday, April 4, 2019 - 11:45:47 AM Last modification on : Friday, August 5, 2022 - 3:03:29 PM
Nabil Badereddine, Leonardo B. Zordan, Patrick Girard, Alberto Bosio. Assist Circuits for SRAM Testing. France, Patent n° : US9418759. 2014. ⟨lirmm-02089903⟩