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Assist Circuits for SRAM Testing

Nabil Badereddine 1 Leonardo B. Zordan 1 Patrick Girard 2 Alberto Bosio 2 
1 IMC - Intel Mobile Communications
2 TEST - Test and dEpendability of microelectronic integrated SysTems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089903
Contributor : Arnaud Virazel Connect in order to contact the contributor
Submitted on : Thursday, April 4, 2019 - 11:45:47 AM
Last modification on : Friday, August 5, 2022 - 3:03:29 PM

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  • HAL Id : lirmm-02089903, version 1

Collections

CNRS | LIRMM | TEST | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Nabil Badereddine, Leonardo B. Zordan, Patrick Girard, Alberto Bosio. Assist Circuits for SRAM Testing. France, Patent n° : US9418759. 2014. ⟨lirmm-02089903⟩

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