Assist Circuits for SRAM Testing

Nabil Badereddine 1 Leonardo B. Zordan 1 Patrick Girard 2 Alberto Bosio 2
1 IMC - Intel Mobile Communications
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Document type :
Patents
Complete list of metadatas
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089903
Contributor : Arnaud Virazel <>
Submitted on : Thursday, April 4, 2019 - 11:45:47 AM
Last modification on : Wednesday, August 28, 2019 - 4:02:58 PM

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  • HAL Id : lirmm-02089903, version 1

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LIRMM | CNRS | MIC | LIRMM_MIC | MIPS | UNIV-MONTPELLIER | TEST

Citation

Nabil Badereddine, Leonardo B. Zordan, Patrick Girard, Alberto Bosio. Assist Circuits for SRAM Testing. France, Patent n° : US9418759. 2014. ⟨lirmm-02089903⟩

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